JDSU's TDD-LTE Drive-Test System Supports Altair Chipsets
By | August 11, 2011
The JDSU E6474A Drive-Test solution now provides TDD-LTE functionality with the introduction of Altair-chipset-device support. This system enables increased productivity via a single test solution that supports multiple types of user equipment (UE).
To accelerate the deployment of TDD-LTE networks, mobile operators and network-equipment manufacturers need to collect and analyze critical LTE RF parametric network data. This is facilitated via the use of real LTE UE such as Altair, which improves testing with end-user-form-factor devices.
Additional solution benefits include:
- Monitoring of key LTE KPIs from a UE-based solution, resulting in faster identification of network issues;
- RF parametric measurements and data performance tests including throughput, MIMO status, power, and signal quality;
- Complete network lifecycle coverage with a single tool that scales from initial trials to on-going optimization and troubleshooting.
